Exploring the Impact of Soft Errors on the Reliability of Real-Time Embedded Operating Systems

The continuous scaling of electronic components has led to the development high-performance microprocessors that are suitable even for safety-critical applications where radiation-induced errors such as Single Event Effects (SEEs) can have a significant impact on performance and reliability system. This work is dedicated investigating systems based programmable hardware Real-time operating Systems (RTOS) in presence architectural faults induced by soft configuration memory hardware. We performed proton radiation test campaigned at PSI facility identify fault model affecting Xilinx Zynq-7020 reconfigurable AP-Soc Device. identified terms SEU MBU clusters been used evaluate proton-induced running within FreeRTOS Microblaze processor. A Multiple Upset resulting from presented, focusing characteristics shape, size, frequency observed cluster errors. conduct two injection campaigns analyze results assess effect size system reliability. Moreover, we discuss software exceptions caused affect structure